DDR-002
2-R-VI (probable die deterioration doubling,to be removed)
Stage C:
Die crack in lower Right wheat grains LDS
Die scratches North-South through TY of LIBERTY LDS
Reported By:
Larry Patterson
US Mint:
San Francisco
Stage C:
Die crack in lower Right wheat grains LDS
Die scratches North-South through TY of LIBERTY LDS
Reported By:
US Mint: